The Focused Ion Beam Scanning Electron Microscope (FIB-SEM) system market is experiencing robust growth, projected to reach a value of $595.5 million in 2025 and maintain a Compound Annual Growth Rate (CAGR) of 5.7% from 2025 to 2033. This expansion is driven primarily by the increasing demand for high-resolution 3D imaging and analysis across diverse scientific and industrial applications. Advancements in materials science, semiconductor manufacturing, and nanotechnology necessitate precise and detailed characterization capabilities, fueling the adoption of FIB-SEM systems. The rising need for failure analysis in electronics and the development of advanced materials with complex microstructures further contribute to market growth. Key players like Thermo Fisher Scientific, Hitachi, Zeiss, JEOL Ltd, Tescan Group, and Raith are driving innovation through technological improvements, expanding product portfolios, and strategic partnerships, fostering competition and accelerating market penetration. The market is segmented by application (e.g., materials science, life sciences, semiconductor), by resolution, and by end-user (e.g., research institutions, industrial labs). While potential restraints could include high initial investment costs and the need for specialized expertise, the overall market outlook remains positive due to the continuous expansion of applications and technological advancements. The historical period (2019-2024) exhibited a growth trajectory consistent with the projected CAGR, indicating a steady market expansion. Future growth will likely be influenced by factors such as government funding for research and development in nanotechnology and materials science, as well as the increasing adoption of FIB-SEM in quality control and process optimization within manufacturing sectors. Furthermore, the development of more user-friendly software and integrated solutions could broaden the user base and drive market expansion. Competitive pressures will likely lead to further price optimization and the introduction of more cost-effective systems, making FIB-SEM technology more accessible to a wider range of users. The geographical distribution of market share will vary based on research and industrial activity, with established economies likely holding a larger share initially.

This dataset contains the raw volume electron microscopy (VEM) data used for the experiments presented in Figure 2 and Figure 3 of our manuscript, "Breaking Free from the Acquisition Dogma for Volume Electron Microscopy". The data supports our findings on supervised and self-supervised denoising strategies for accelerating VEM acquisition. All data was acquired from a mouse brain tissue sample using a Serial Block-Face Scanning Electron Microscope (SBF-SEM). XY pixel size for all tiff stacks is 15 nm.

This repository is organized into two main parts corresponding to the figures in the paper:

1. Supervised Denoising

SBEM2-Z50-fast.tif: A 3D TIFF stack of the snapshot stack. This volume was acquired with 0.5us pixel dwell time and a 50 nm section thickness.

SBEM2-Z50-slow.tif: A 3D TIFF stack of the reference stack. This volume was acquired with 2us pixel dwell time and a 50 nm section thickness.

2. Self-Supervised Denoising on Ultra-Thin Sections

SBEM3-Z20-300.tif, SBEM3-Z25-300.tif, SBEM3-Z50-300.tif: 3D TIFF stacks with acquired with 20 nm, 25nm and 50nm section thickness, respectively. Each stack contains about 300 slices. These stacks serves as the input for our self-supervised denoising model.

3D ultrastructure of myelinated and unmyelinated axons in a rat pelvic nerve visualized by serial block-face scanning electron microscopy (SBF-SEM)

The Cryo-Focused Ion Beam Scanning Electron Microscope (Cryo-FIB-SEM) market is experiencing robust growth, driven by advancements in cryogenic microscopy techniques and the increasing demand for high-resolution 3D imaging in diverse scientific fields. The market, estimated at $250 million in 2025, is projected to exhibit a Compound Annual Growth Rate (CAGR) of 15% from 2025 to 2033, reaching approximately $800 million by 2033. Key drivers include the rising need for detailed structural analysis in materials science, nanotechnology, and biological research, particularly in studying sensitive biological samples without the artifacts introduced by traditional preparation methods. The ability of Cryo-FIB-SEM to provide high-resolution images of frozen hydrated samples makes it invaluable for studying cellular structures, macromolecular complexes, and other delicate specimens. Technological innovations, such as improved ion beam control and automation, are further accelerating market expansion. Market segmentation is primarily driven by application (e.g., materials science, life sciences), instrument type (e.g., standalone systems, integrated platforms), and geography. Major players like JEOL, Carl Zeiss, and Thermo Fisher Scientific are actively investing in research and development to enhance the capabilities of their Cryo-FIB-SEM offerings and expand their market share. Market restraints include the high cost of equipment and maintenance, specialized expertise required for operation, and the relatively small number of researchers with extensive training in cryogenic microscopy. However, ongoing technological advancements are gradually reducing operational complexities and driving down costs, potentially mitigating these restraints. The growing adoption of Cryo-FIB-SEM in academic institutions and research organizations is expected to fuel growth, alongside increasing collaboration between researchers and manufacturers for customized applications. Future market growth will hinge on the continuous development of more user-friendly interfaces, enhanced automation capabilities, and the expansion of applications into new areas like drug discovery and advanced materials characterization. The North American market currently holds a significant share, followed by Europe and Asia, with emerging economies exhibiting promising growth potential.

Materials qualification of reactor structural materials is a critical step in rapid implementation of advanced nuclear reactor technologies, particularly to assess the corrosion performance in these designs. Accelerated qualification of reactor structural materials requires incorporating powerful computational toolsets, such as phase field modelling in the Multiphysics Object-Oriented Simulation Environment (MOOSE) framework, to predict the evolution of structural materials due to corrosion. Accordingly, computational toolsets will require experimental data generated at appropriate length scales to validate accuracy. Focused ion beam (FIB) provides a high degree of control over manipulation of materials for analytical purposes, including capturing data on the evolution in the microstructure and elemental composition of materials at the mesoscale, an appropriate length scale for phase field modelling of intergranular diffusion phenomena using the MOOSE framework. For instance, the FEI Helios G4 UX dual beam plasma FIB microscope at the Irradiated Materials Characterization Laboratory (IMCL) is capable of backscatter diffraction (EBSD) and energy-dispersive x-ray spectroscopy (EDS) documenting the evolution in the microstructure and elemental composition, respectively. The Helios can perform EDS and EBSD three-dimensionally (3D) using tomography, which is then combined using different software packages to visualize 3D volumes correlating elemental composition to microstructural data. The purpose of this investigation was to develop a streamlined characterization and data processing workflow for 3D tomography studies on the FEI Helios G4 plasma FIB. The investigation is segmented into three parts: 1) Optimizing the data collection workflow, 2) identifying appropriate data processing and visualization software (i.e. DREAM.3D, MIPAR, and VGStudioMax), and 3) establishing an infrastructure for public release. The optimization of the data collection workflow is in collaboration with members of the U220 department to setup formal training on the tomography operation of the G4, through ThermoFisher Scientific, and exploring DREAM.3D, MIPAR, and VGStudioMax data processing/visualization software packages. VGStudioMax currently demonstrates the most promise for future use. Optimization of the data collection and processing workflow is still ongoing. A collaboration with INL High Performance Computing (HPC) established an open-source license for expediting the public release of FIB tomography datasets through HPC. FIB tomography data generated by the G4 will provide comprehensive data for validating 3D phase field mesoscale modelling tools within the MOOSE framework for accelerated qualification of reactor structural materials. label::after { content: "" !important; }

We used Focused Ion Beam/Scanning Electron Microscopy (FIB/SEM) to perform a 3D analysis of the synapses in the layer III neuropils of the Brodmann areas 3b (somatosensory), 4 (motor), and 17 (visual primary) from human brain samples. 3 human brain autopsies cases have been used to achieve a total of 22 FIB/SEM valid image stacks: 4 stacks in BA17 from a single case (AB7); 9 stacks in BA3b (three stacks per case, AB2, AB3, and AB7); and 9 stacks in BA4 (three stacks per case, AB2, AB3, and AB7). Specifically, we studied synaptic junctions, which were fully reconstructed in 3D. We analyzed the synaptic density, 3D spatial distribution, and type (excitatory and inhibitory), as well as the shape and size of each synaptic junction. Moreover, their postsynaptic targets were determined. The present dataset constitutes a detailed description of the synaptic characteristics of the human cortex, which is a necessary step to better understand the organization of the cortex.

Focused ion beam (FIB) tomography is a destructive technique used to collect three-dimensional (3D) structural information at a resolution of a few nanometers. For FIB tomography, a material sample is degraded by layer-wise milling. After each layer, the current surface is imaged by a scanning electron microscope (SEM), providing a consecutive series of cross-sections of the three-dimensional material sample. Especially for nanoporous materials, the reconstruction of the 3D microstructure of the material, from the information collected during FIB tomography, is impaired by the so-called shine-through effect. This effect prevents a unique mapping between voxel intensity values and material phase (e.g., solid or void). It often substantially reduces the accuracy of conventional methods for image segmentation. Here we demonstrate how machine learning can be used to tackle this problem. A bottleneck in doing so is the availability of sufficient training data. To overcome this problem, we present a novel approach to generate synthetic training data in the form of FIB-SEM images generated by Monte Carlo simulations. Based on this approach, we compare the performance of different machine learning architectures for segmenting FIB tomography data of nanoporous materials. We demonstrate that two-dimensional (2D) convolutional neural network (CNN) architectures processing a group of adjacent slices as input data as well as 3D CNN perform best and can enhance the segmentation performance significantly.

Dataset of raw and image processed 3D Cryo-FIB SEM data recorded from Mallomonas cells.

The Focused Ion Beam Scanning Electron Microscope (FIB-SEM) market is experiencing steady growth, projected to reach a value of $1638.9 million in 2025 and maintain a Compound Annual Growth Rate (CAGR) of 4.2% from 2025 to 2033. This growth is fueled by increasing demand across diverse sectors, including semiconductor manufacturing, materials science research, and life sciences. Advancements in FIB-SEM technology, such as improved resolution, faster imaging speeds, and enhanced automation, are key drivers. The ability to perform high-precision 3D imaging and micro-fabrication makes FIB-SEMs indispensable for applications requiring detailed nanoscale analysis. The market is segmented by application (e.g., semiconductor failure analysis, materials characterization, biological sample imaging), and by geographic region, with North America and Europe currently dominating due to strong research infrastructure and a high concentration of leading companies such as Thermo Fisher Scientific, Hitachi High-Technologies Corporation, JEOL Ltd., Carl Zeiss, and Tescan Group. Competition is intense, with companies focusing on innovation and strategic partnerships to expand their market share. Despite the positive outlook, challenges remain. The high cost of FIB-SEM systems is a significant barrier to entry, particularly for smaller research institutions and companies in developing economies. Furthermore, the need for specialized expertise to operate and maintain these complex instruments presents a limitation. However, ongoing technological advancements, alongside the increasing availability of financing options and service contracts, are expected to mitigate these restraints gradually. The market is expected to witness considerable innovation in areas such as automation, higher throughput, and user-friendly software, leading to wider adoption and accessibility. The increasing adoption of advanced analytical techniques combined with the growing need for higher resolution imaging will contribute to the market's expansion.

3D x-ray tomography and 2D scanning electron microscopy (SEM) data behind the publications:

Salling FB, Jeppesen N, Sonne MR, Hattel JH and Mikkelsen LP. Individual fibre inclination segmentation from X-ray computed tomography using principal component analysis. Composites Part A, Submitted

to where the reference should be given if used.

Details on the data-set is given in the Data-in-Brief publications:

Salling FB, Hattel JH, Mikkelsen LP. X-ray computed tomography and scanning electron microscopy datasets of unidirectional and textured glass fibre composites. Data in Brief, Submitted

The data-files is given for the two material case called Mock and UD. For each material case, the data is given as:

• .txm-files: 3D reconstructed x-ray scan files
  • FoV 2mm binning 2 (analyzed in the paper)
  • FoV 4mm binning 1 (additional data-set)
• 2Dtif.zip-files: 2D tif-stack version of the 3D reconstructed data-set
• .tif-files: stitched SEM scanning file used for fiber volume fraction determination
• .hdr-files: meta-data ASCII file behind the SEM scan
• tif.zip-files: The individual images behind the stitched SEM scanning file
• fig-files: digital form of the fibre trajectories colored according to their individual mean inclination used in figure xx in reference yy
• m-files: Matlab-script for calculating the fibre volume fraction (Vf) from the SEM image
• mat-files: Mat-file with the segmented part in the SEM image used for the Vf calculation

Human Cytomegalovirus (HCMV) can infect a variety of cell types by using virions of varying glycoprotein compositions. It is still unclear how this diversity is generated, but spatio-temporally separated envelopment and egress pathways might play a role. So far, one egress pathway has been described in which HCMV particles are individually enveloped into small vesicles and are subsequently exocytosed continuously. However, some studies have also found enveloped virus particles inside multivesicular structures but could not link them to productive egress or degradation pathways.We used a novel 3D-CLEM workflow allowing us to investigate these structures in HCMV morphogenesis and egress at high spatio-temporal resolution. We found that multiple envelopment events occurred at individual vesicles leading to multiviral bodies (MViBs), which subsequently traversed the cytoplasm to release virions as intermittent bulk pulses at the plasma membrane to form extracellular virus accumulations (EVAs). Our data support the existence of a novel bona fide HCMV egress pathway, which opens the gate to evaluate divergent egress pathways in generating virion diversity. Methods Details on data acquisition and processing can be found in the original publication. The uploaded here are the unprocessed raw data.

The global Focused Ion Beam Scanning Electron Microscope (FIB-SEM) system market is experiencing robust growth, projected to reach $578.3 million in 2025 and maintain a Compound Annual Growth Rate (CAGR) of 5.5% from 2025 to 2033. This expansion is driven by several key factors. Advancements in semiconductor technology necessitate higher resolution imaging and precise material modification at the nanoscale, fueling demand for FIB-SEM systems in research and development. The increasing adoption of FIB-SEM in life sciences, particularly for 3D cellular imaging and analysis, further contributes to market growth. Material science applications, such as failure analysis and characterization of new materials, also represent a significant market segment. The market is segmented by ion source type (Ga Ion Source and Non-Ga Ion Source) and application (Material Science, Life Sciences, and Semiconductor). Leading players like Thermo Fisher Scientific, Hitachi, Zeiss, JEOL Ltd, Tescan Group, and Raith are driving innovation and competition within this dynamic market. Geographical distribution reveals a strong presence across North America, Europe, and Asia Pacific, reflecting the concentration of research institutions and advanced manufacturing facilities in these regions. Growth in emerging markets, such as those in Asia Pacific and the Middle East & Africa, is anticipated to be significant in the coming years, driven by increasing investment in scientific research and technological advancement. While the market faces some restraints, such as the high cost of FIB-SEM systems and the need for specialized expertise for operation and maintenance, the overall growth trajectory remains positive, propelled by continuous technological innovations and the expanding applications of FIB-SEM across various scientific disciplines. The market is expected to see significant growth across all segments with the semiconductor industry and life sciences expected to be the most prominent growth drivers in the coming years.

The global Scanning Electron Microscope (SEM) market, valued at $3.718 billion in 2025, is projected to experience robust growth, driven by increasing demand across life sciences, materials science, and nanotechnology research. The compound annual growth rate (CAGR) of 4.5% from 2025 to 2033 indicates a steady expansion, fueled by advancements in SEM technology, such as improved resolution, faster imaging speeds, and enhanced analytical capabilities. The life sciences sector, particularly in drug discovery and development, is a significant driver, leveraging SEM for high-resolution imaging of biological samples. Materials science applications, including semiconductor analysis and material characterization, also contribute substantially to market growth. The increasing adoption of FIB-SEM (Focused Ion Beam Scanning Electron Microscope) systems, offering superior 3D imaging and micro-machining capabilities, further propels market expansion. While competitive pricing pressures and the high initial investment cost of SEMs can pose challenges, the overall market outlook remains positive, driven by continued technological innovation and growing research funding across various sectors. The market segmentation reveals a strong presence of established players such as Thermo Fisher Scientific, Hitachi High-Technologies Corporation, and JEOL Ltd., indicating a competitive landscape. However, emerging companies are also contributing with innovative solutions and niche applications. Regional market analysis suggests a strong concentration in North America and Europe, reflecting advanced research infrastructure and high adoption rates. However, the Asia-Pacific region is expected to demonstrate considerable growth potential due to rising investments in research and development and the increasing manufacturing activity in emerging economies such as China and India. The continued integration of SEMs with other analytical techniques and the development of user-friendly software solutions will further enhance the accessibility and application of this crucial technology across diverse research fields.

Serial block-face (SBF) scanning electron microscopy (SEM) is used for imaging the entire internal ultrastructure of cells, tissue samples or small organisms. We developed a workflow for SBF SEM of adherent cells, such as Giardia parasites and HeLa cells, attached to the surface of a plastic culture dish, which preserves the interface between cells and plastic substrate. Cells were embedded in situ on their substrate using silicone microwells and were mounted for cross-sectioning which allowed SBF imaging of large volumes and many cells. In total we provide 10 data sets with image series from SBF SEM of Giardia and HeLa cells prepared with protocol variants to improve the workflow. A detailed description of the methods and the data set is provided in the download container.

Data set 03 comprises an image 3D model of a Giardia lamblia cell adhered to the plastic substrate of a culture dish. The model was generated by segmentation of the entire cell, the cell nuclei (red) and the ventral disc cytoskeleton (yellow) in an image series of 276 images which was recorded by SBF SEM (see dataset 01). Section interval was 50 nm and pixel size 10 nm. The data folder contains the model-file (Imaris-format) and a 360° rotation of the model as video file (mp4-format).

The brain contains thousands of millions of synapses, exhibiting diverse structural, molecular, and functional characteristics. However, synapses can be classified into two primary morphological types: Gray’s type I and type II, corresponding to Colonnier’s asymmetric (AS) and symmetric (SS) synapses, respectively. AS and SS have a thick and thin postsynaptic density, respectively. In the cerebral cortex, since most AS are excitatory (glutamatergic), and SS are inhibitory (GABAergic), determining the distribution, size, density, and proportion of the two major cortical types of synapses is critical, not only to better understand synaptic organization in terms of connectivity, but also from a functional perspective. However, several technical challenges complicate the study of synapses. Potassium ferrocyanide has been utilized in recent volume electron microscope studies to enhance electron density in cellular membranes. However, identifying synaptic junctions, especially SS, becomes more challenging as the postsynaptic densities become thinner with increasing concentrations of potassium ferrocyanide. Here we describe a protocol employing Focused Ion Beam Milling and Scanning Electron Microscopy for studying brain tissue. The focus is on the unequivocal identification of AS and SS types. To validate SS observed using this protocol as GABAergic, experiments with immunocytochemistry for the vesicular GABA transporter were conducted on fixed mouse brain tissue sections. This material was processed with different concentrations of potassium ferrocyanide, aiming to determine its optimal concentration. We demonstrate that using a low concentration of potassium ferrocyanide (0.1%) improves membrane visualization while allowing unequivocal identification of synapses as AS or SS.

Raw Scanning electron micoroscope (SEM) Images for publication Sikora P., Skibicki S., Chougan M., Szewczyk P., Cendrowski K., Federowicz K., El-Khayatt A.M., Saudi H.A., Strzałkowski J., Abd Elrahman M., Techman M., Sibera D., Chung S.Y. Silica-coated admixtures of bismuth and gadolinium oxides for 3D printed concrete applications: Rheology, hydration, strength, microstructure, and radiation shielding perspective. Construction and Building Materials (2025) 470, 140563, https://doi.org/10.1016/j.conbuildmat.2025.140563

In this project I work on developing ways to use a FIB-SEM to create a 3D model of biological samples. The method can be used in several projects with Grøn Dyst angles and I here report on my work on imaging malaria infected blood cells which is essential for a deeper understanding of how the parasite might be targeted by medicine, and algae samples that are essential for ecotoxicologial studies and later will be used for algae species used in biomass and biofuel production.

Research data that supports the findings presented in the manuscript "Stochastic 3D modeling of nanostructured NVP/C active material particles for sodium-ion batteries" published in Batteries & Supercaps (https://doi.org/10.1002/batt.202300409).

This includes

1) Experimental image data obtained by focused ion beam scanning electron microscopy (FIB-SEM), high-resolution SEM (HR-SEM), transmission electron microscopy (TEM), and enery-dispersive X-ray spectoscropy (EDX). Imaging is described in Section 2.3.

2) Segmented image data of FIB-SEM stack and HR-SEM images, which build the basis for calibrating the stochastic model in Section 3.2. The segmentation has been performed as described in Section 2.4.

3) Virtual nanostructures generated by the stochastic model in order to study structure-property relationships in Section 4.2.

Abstract The incorporation of fibers on cement composites reduces its fragility, turning it a ductile material. The amount of fibers and its distribution presents a large influence on the composite performance, especially by the fact that it is self-consolidating, which facilitates the fiber distribution. 3D microtomography is an efficient tool for determining the fibers distribution, generating images and creating a representation in three dimensions of the sample. Moreover, the scanning electron microscopy (SEM) can be used to analyze the interaction of fibers with the cement composite. The purpose of this paper is to investigate the application of these techniques to visualize the distribution and interaction of metallic and polypropylene fibers inserted into an advanced cementitious composite, at 3% in volume content. The results presented these techniques' efficiency in the verification of fibers distribution within the mixture and the absence of flaws in the composition.