Mean reaction time (RTs; in ms) followed by the Standard Error of the Mean (SEM) and mean proportion of errors (ERR; in %) followed by standard deviation (SD), depicted separately for same and switched additions (+) and subtractions (−), for the original symbol-switching task (from Experiment 1), the symbol-switching task with letters (from Experiment 2), and the stimulus offset condition from Experiment 2, where the letters offset upon response (Fast Offset).

Mean reaction times (RTs, in ms) followed by the Standard Error of the Mean (SEM) and mean proportion of errors (ERR) followed by standard deviation (SD), for big and small single line or two crossed line stimuli, depicted separately for no switch (Same), switched size, switched symbol and size and symbol switched conditions of Experiment 3.

Mean reaction times (RTs; in ms) followed by the Standard Error of the Mean (SEM) and mean proportion of errors (ERR, in %) followed by standard deviation (SD) for same and switched addition (+) and subtraction (−) conditions, listed separately for the arithmetic task and the symbol-identification task of Experiment 1.

Aggregate statistics (mean, (standard deviation) [minimum, maximum]) of daily entropy rate and limit of probability of different types of segments over 10 houses.

Standard error of measurement (SEM) and minimal detectable change (MDC) of the 5 segments and the C-DVT (n = 44).

• figures are represented as mean ± standard deviation, unless noted otherwiseComparison of Lhermitte’s Sign (LS) vs non-LS patients with VMAT radiation to the head and neck, without chemotherapy *.