NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for selected elements (binding energy, Auger kinetic energy, chemical shift, and surface or interface core-level shift), retrieval of data for selected compounds (according to chemical name, selected groups of elements, or chemical classes), display of Wagner plots, and retrieval of data by scientific citation. For the newer data records, additional information is provided on the specimen material, the conditions of measurement, and the analysis of the data. Version 5.0 includes the addition of Digital Object Identifiers (DOI) to each of the citations. Additionally, Version 5.0 has new features including chemical shift plots, custom-built components for displaying both formatted molecular formulas and formatted spectral lines, and spectral sorting functions of photoelectron lines and Auger Parameters.

XPS data. Peaks fitting using the CasaXPS software.

The raw XPS data, corresponding to Fig. 1(a), Fig. 2(a), Fig. 2(b), and Fig. 3(a), are involved in .csv files. A C 1s spectrum on a C6H12-adsorbed Cu(111) surface and Cu 3p spectra on clean Pd-Cu(111) surfaces are also uploaded, which were used as references for coverage estimation of HCOOH and Pd.The results of DFT calculations (including total energy, geometry, Mulliken charge population, and so on) are involved in .out files. The beginning part of those files are identical to corresponding input files.

Characterization data such as XRD and XPS. This dataset is associated with the following publication: Desai, I., M. Nadagouda, M. Elovitz, M. Mills, and B. Boulanger. Synthesis and Characterization of Magnetic Manganese Ferrites. Materials Science for Energy Technologies. Elsevier B.V., Amsterdam, NETHERLANDS, 2(2): 150-160, (2019).

XPS data of fracture surfaces and surfaces with freshly prepared MPTMS

XPS survey spectra and detailed spectra O1, C1s and Mn2p of as-grown BDD, as-implanted Mn-BDD, and annealed Mn-BDD thin films. X-ray photoelectron spectroscopy (XPS) studies were conducted on an Escalab 250 Xi from Thermo Fisher Scientific with an Al Kα radiation. Results were published in the paper ( https://doi.org/10.1002/adfm.202308617)

X-ray photoelectron spectroscopy (XPS) data for the five photocatalysts in this study (PC1-PC5) on mesoporous NiO thin films. XPS data was recorded on a Thermo Scientific K-Alpha instrument. The X-ray source was microfocused monochromatic AlKa, with an energy of 1486.6 eV, voltage = 12 kV, current = 3 mA, and power = 36W (at 400 µm spot size). The emission angle was at zero degrees. Pass energy for the survey regions was 150 eV with a step size of 0.4 eV and high-resolution regions had a pass energy of 40 eV with a step size of 0.1 eV. The samples were mounted on a clean aluminium plater and immobilised using double sided adhesive tape. Spectra were analysed using CasaXPS software (version 2.3.16).

Bacteria generally interact with the environment via processes involving their cell-envelope. Thus, techniques that may shed light on their surface chemistry are attractive tools for providing an understanding of bacterial interactions. One of these tools is Al Kα-excited photoelectron spectroscopyspectrometry (XPS) with an estimated information depth of <10 nm. XPS-analyses of bacteria have been performed for several decades on freeze-dried specimens in order to be compatible with the vacuum in the analysis chamber of the spectrometer. A limitation of these studies has been that the freeze-drying method may collapse cell structure as well as introduce surface contaminants. However, recent developments in XPS allow for analysis of biological samples at near ambient pressure (NAP-XPS) or as frozen hydrated specimens (cryo-XPS) in vacuum. In this work, we have analyzed bacterial samples from a reference strain of the Gram-negative bacterium Pseudomonas fluorescens using both techniques. We compare the results obtained and, in general, observe good agreement between the two techniques. Relevant high resolution C 1s XPS data sets are upload. Furthermore, we discuss advantages and disadvantages with the two analysis approaches and the output data they provide. XPS reference data from the bacterial strain are provided and we suggest that planktonic cells of this strain (DSM 50090) may be used as a reference material for surface chemical analysis of bacterial systems.

This data set relates to M. Kjaervik et al., Comparative study of NAP-XPS and cryo-XPS for the investigation of surface chemistry of the bacterial cell-envelope, published in Innovative Methodologies for the Chemical Characterization of Biomaterial Surfaces by X-ray Photoelectron Spectroscopy (XPS) for Biotechnological Applications, Frontiers in Chemistry, 9, 2021, DOI 10.3389/fchem.2021.666161

Raw data were used to assess the metallic pollution in the Moctezuma River at Moctezuma, Sonora, México. This set of data belongs to "LCyRA" of Universidad Estatal de Sonora and came from an XPS (X-ray photoelectron spectroscopy) incinerated fish tissue analysis performed at "DIFUS-UNISON." This data set corresponds to electrons' binding energies in diverse elements' atoms and may be interpreted to obtain the results.

We present the JuCLS (Jülich core-level shifts) database which collects first principles calculations of core-level binding energies and core-level shifts (also known as chemical shifts). The calculations for this database were performed with the FLEUR program [1], a feature-full, freely available, open source FLAPW (full-potential linearized augmented planewave) code, based on density-functional theory. The FLAPW-method is a very accurate all-electron method which within density functional theory is universally applicable to all atoms of the periodic table. All calculations are run with AiiDA through workflows within the AiiDA-FLEUR package (version 0.12.3) [2]. Our database collects predicted core-level shifts, binding energies for X-ray photoelectron spectroscopy (XPS) and as a side product formation energies. Core-level shifts are calculated within the initial state approximation and binding energies are extracted from core-hole simulations. The JuCLS v1.0 contains initial state core-level shifts and formation energies on 4435 of the 5058 stable binary metals from the Materials project database (MP) and calculations on 1271 elemental crystals from the Inorganic Crystal Structure Database (ICSD). This corresponds currently to over 130 000 unique core-level shifts and over 15 000 unique main line core-level shifts. The JuCLS database allows for the construction of theoretical X-ray photoelectron spectra containing a possible mixture of these materials. Furthermore, it allows for a direct chemical characterization of materials.

[1] https://flapw.de and www.judft.de [2] https://github.com/JuDFTteam/aiida-fleur

The NIST Electron Inelastic-Mean-Free-Path Database provides values of electron inelastic mean free paths (IMFPs) principally for use in surface analysis by Auger-electron spectroscopy and X-ray photoelectron spectroscopy. The database includes IMFPs calculated from experimental optical data and IMFPs measured by elastic-peak electron spectroscopy. If no calculated or measured IMFPs are available for a material of interest, values can be estimated from the predictive IMFP formulae of Tanuma et al. and of Gries. IMFPs are available for electron energies between 50 eV and 10,000 eV although most of the available data are for energies less than 2,000 eV. A critical review of calculated and measured IMFPs has been published [C. J. Powell and A. Jablonski, J. Phys. Chem. Ref. Data 28, 19 (1999)].

From manuscript: "Survey and high-resolution (Mg 1s, Mg 2p, S 2p) X-ray photoelectron spectra of as-received magnesium sulfide powder (99.9%) are presented, including surface contaminants that originate from exposure to atmosphere, (C 1s, O 1s). Minor impurities derived from sample synthesis (Al 2s, Al 2p) and packaging or processing (F 1s) are noted in the survey spectrum."

The datasets from Cyclic Voltammetry, Transmision Electron Microscopy, X-ray Diffraction, and (Hard Energy) X-ray Photoelectron Spectroscopy are related to the publication

H. Habibimarkani, S.-L. Abram, A. Guilherme Buzanich, C. Prinz, M. Sahre, V.-D. Hodoroaba and J. Radnik

"In-depth analysis of FeNi-based nanoparticles for the oxygen evolution reaction"

Scientific Reports (2025), https://doi.org/10.1038/s41598-025-92720-3

Details of the materials and the experimental procedures are described in this publications.

The filenames reflects the Fe:Ni ratio

The data are given as tif-files for TEM (*tif). as asc ii files for XRD (*.nja) and as vamas data files for the XPS/HAXPES raw-data (*.npl). The CV results are given in excel sheet. The data are given in zif-files.

The NIST Electron Effective Attenuation Length Database provides values of electron effective attenuation lengths (EALs) in materials at user-selected electron energies between 50 eV and 2,000 eV. The database was designed mainly to provide EALs (to account for effects of elastic-electron scattering) for measurements of the thicknesses of overlayer films and, to a much lesser extent, for measurements of the depths of thin marker layers. EALs are calculated using an algorithm based on electron transport theory for measurement conditions specified by the user. A critical review on the EAL has been published [A. Jablonski and C. J. Powell, Surf. Science Reports 47, 33 (2002)], and simple practical expressions for the EAL, mean escape depth, and information depth are given in another paper by the same authors [J. Vac. Sci. Technol. A 27, 253 (2009)].

The high-resolution C1s X-ray absorption spectra of BDD@H and BDD@D samples were measured using the facilities of the HE-SGM beamline (HE-SGM) at the BESSY II synchrotron radiation source of Helmholtz–Zentrum Berlin (HZB).[90] The measurements were carried out under ultra-high vacuum conditions: P ≈ 2×10−9 Torr at T = 300 K. The NEXAFS spectra were obtained by recording the total electron yield (TEY) using PEY/TEY detector. The monochromator energy resolution near the C1s absorption edge (hv ≈ 285 eV) was ≈100 meV. The size of the X-ray spot on the sample was ≈1200 × 200 μm. The photon energies in the range of the fine structure of the C1s X-ray absorption spectra were calibrated against the energy position of the first narrow peak in the C1s X-ray absorption spectrum of HOPG (hv ≈ 285.45 eV).[91,92] No radiation damage of the samples was observed during the entire duration of the experiment. The BDD@D and BDD@H were synthesized in the Microwave Plasma Assisted Chemical Vapor Deposition process. Diamond films were deposited on p-type (100) silicon substrates (1 × 1 cm2) and studied by Raman spectroscopy.

The X-ray Photoelectron Spectroscopy (XPS) market is projected to be valued at $801.8 million in 2025, exhibiting a Compound Annual Growth Rate (CAGR) of 1.8% from 2025 to 2033. This steady growth reflects the enduring importance of XPS in materials characterization across diverse sectors. The demand for advanced materials analysis in industries such as semiconductors, pharmaceuticals, and energy continues to fuel market expansion. Technological advancements, including the development of higher-resolution instruments and improved data analysis software, further enhance the capabilities and appeal of XPS, attracting new users and applications. The presence of established players like Thermo Fisher Scientific and JEOL, alongside innovative companies like Kratos Analytical and Scienta Omicron, indicates a competitive yet dynamic market landscape. While precise segmentation data is unavailable, it's reasonable to infer substantial contributions from academic research institutions, alongside significant industrial applications across various sectors. The market's growth is likely influenced by factors such as increasing research and development activities and stringent quality control requirements within various industries. Despite the steady growth, certain challenges may exist. The high cost of instrumentation and the need for specialized expertise to operate and interpret XPS data could potentially limit market penetration to some extent. However, these obstacles are likely mitigated by the invaluable insights XPS offers, making it an indispensable tool for many research and development processes and quality control measures. Furthermore, the ongoing trend towards miniaturization and automation in XPS systems could broaden accessibility and reduce operational costs in the future, further accelerating market expansion. The overall outlook for the XPS market remains positive, driven by sustained demand and consistent technological improvements.

XPS data in VAMAS format for the Surface and Interface Analysis paper entitled " Revisiting Degradation in the XPS Analysis of Polymers". DOI: 10.1002/sia.7151

Recommended analysis software is CasaXPS, minimum of Version 2.3.24

247 Global import shipment records of Xps Board with prices, volume & current Buyer's suppliers relationships based on actual Global export trade database.

X-ray Photoelectron Spectroscopy (XPS) Market Outlook

The global X-ray Photoelectron Spectroscopy (XPS) market size is expected to experience significant growth from 2023 to 2032, with the market valued at approximately USD 0.7 billion in 2023. It is projected to reach around USD 1.2 billion by 2032, growing at a compound annual growth rate (CAGR) of 6.5% during the forecast period. This growth is primarily driven by the increasing demand for advanced material analysis techniques in various industries such as electronics, healthcare, and materials science, among others. The ability of XPS to provide detailed insights into the surface chemistry of a wide range of materials makes it an invaluable tool in both research and industrial applications, thus propelling market expansion.

The growing emphasis on high-performance materials and the need for precise material characterization is fueling the demand for X-ray Photoelectron Spectroscopy (XPS) systems. Industries such as electronics and aerospace heavily rely on XPS for analyzing thin films, coatings, and surface modifications, which are crucial for developing new materials and improving existing products. Additionally, the advent of nanotechnology has spurred the requirement for advanced analytical techniques like XPS to study nanoscale materials, thus further driving the market. The focus on enhancing product quality, optimizing manufacturing processes, and ensuring compliance with stringent regulations are also significant factors contributing to the growth of the XPS market.

Another critical growth factor for the XPS market is the increasing investment in research and development across various industries and academic institutions. Governments and private organizations are investing heavily in developing new materials and technologies, which necessitates the use of sophisticated analytical tools like XPS for surface analysis. The push towards innovation in sectors such as healthcare, where surface analysis of biomaterials is vital, further underscores the importance of XPS. As researchers strive to uncover new material properties and applications, the demand for XPS systems is expected to grow, supporting the overall market expansion during the forecast period.

Technological advancements in XPS instrumentation are also playing a pivotal role in the growth of the market. Recent developments include enhancements in spectral resolution, detection capabilities, and data processing, making XPS systems more efficient and user-friendly. These advancements have increased the accessibility of XPS technology to a broader range of industries and applications. The integration of artificial intelligence and machine learning for data interpretation and analysis is also expected to enhance the capabilities of XPS systems, opening new avenues for market growth. As these technologies continue to evolve, they are likely to bolster the adoption of XPS in both existing and new application areas.

From a regional perspective, the Asia Pacific region is anticipated to dominate the XPS market during the forecast period, driven by increasing industrialization and research activities in countries such as China, Japan, and South Korea. The presence of a robust electronics manufacturing sector, coupled with significant investments in materials science research, is expected to contribute to the growth of the market in this region. North America and Europe are also key regions for the XPS market, owing to their strong research infrastructure and established industries. Meanwhile, Latin America and the Middle East & Africa are expected to witness moderate growth, driven by developing industrial sectors and increasing focus on research and development activities.

Product Type Analysis

In the X-ray Photoelectron Spectroscopy (XPS) market, product type segmentation is critical, as it determines the system's capability to address specific analytical needs. Monochromatic XPS systems are renowned for their ability to provide high-resolution spectra, which is essential for detailed surface chemical analysis. These systems utilize a monochromator to create a highly focused X-ray beam, which significantly enhances the quality of the data obtained. The demand for monochromatic XPS systems is growing, particularly in research-intensive applications where precise surface characterization is crucial. Industries such as electronics and nanotechnology are increasingly adopting monochromatic XPS for its superior analytical performance, thereby driving this segment's growth.

Non-monochromatic XPS systems, on the other hand, are often preferred f

Data foldersFigure 1. AFM images showing the effect of different acid treatments on HOPG surfaces: (a) 0.25 M HNO3; (b) 0.5 M HNO3; (c) 5.0 M HNO3; (d) 2.0 M HCl; (e) Corresponding line profiles; (f) XP spectrum of (1s) region from image (b).Figure 2: EXCEL chart of contact angle measurements of water on HCl treated HOPG surfaces before and after heating to 473 K. Figure 3. XPS spectra of HOPG samples pre-treated with HCl at different concentrations and then, after drying, to a 2×10-6 M aqueous solution of HAuCl4. Curve fitting of the spectra is discussed above. Figure 4: AFM images of HOPG surfaces treated with HCl and subsequently with a 2×10-6 M aqueous solution of HAuCl4. (a) After treatment with 1 M HCl; (b) 0.5 M HCl followed by 2×10-6 M HAuCl4; (c) 1.0 M HCl followed by 2×10-6 M HAuCl4; (d) 1.0 M HCl, heated to 373 K followed by 2×10-6 M HAuCl4;Figure 5. XPS spectra showing the deposition of gold from a 2×10-6 M aqueous solution of HAuCl4 on HOPG surfaces pre-treated with HNO3 at different concentrations: (a) clean surface treated with gold solution; (b) 0.25 M HNO3; (c) 0.5 M HNO3; (d) 1.0 M HNO3; (e) 2.0 M HNO3; (f) 5.0 M HNO3. Curve fitting of the spectra is discussed above.Figure 6: AFM images of HOPG surfaces treated with HNO3 and subsequently with a 2×10-6 M aqueous solution of HAuCl4. (a) After treatment with 2 M HNO3 followed by 2×10-6 M HAuCl4; (b) After treatment with 5 M HNO3 followed by 2×10-6 M HAuCl4;Figure 7. XPS spectra showing the effect of aqua regia (AQR, 3HCl: 1HNO3) treatment on gold deposition from a 2×10-6 M aqueous solution of HAuCl4 on HOPG surfaces. (a) O(1s) spectrum showing the oxygen states generated on a clean surface by 5.0 M AQR treatment. Spectra (b)-(f) show gold deposition on the HOPG after treatment with AQR at increasing concentrations: (b) 0.25 M AQR; (c) 0.5 M AQR; (d) 1.0 M AQR; (e) 2.0 M AQR; (f) 5.0 M AQR. Figure 8: AFM images of HOPG surfaces treated with aqua regia (AQR, 3HCl: 1HNO3) and subsequently with a 2×10-6 M aqueous solution of HAuCl4. (a) After treatment with 0.25 M AQR (b) After treatment with 1 M AQR followed by 2×10-6 M HAuCl4;Figure 9. XPS spectra showing the effect of H2SO4 treatment of HOPG surfaces on gold deposition from a 2×10-6 M aqueous solution of HAuCl4. (a) After 0.1 M H2SO4; (b)-(f) show gold deposition on the HOPG after treatment with H2SO4 at increasing concentrations: (b) 0.1 M H2SO4; (c) 0.2 M H2SO4; (d) 0.3 M H2SO4. Figure 10: AFM images of HOPG surfaces treated with H2SO4 and subsequently with a 2×10-6 M aqueous solution of HAuCl4. (a) After treatment with 0.1 M H2SO4; (b) 0.1 M H2SO4 followed by 2×10-6 M HAuCl4; Figure 11. A comparison of curve fits of the O(1s) spectra from Figure 8. In (a) and (b) fits to the acid treated surface spectrum using two and three components respectively are compared. Whilst two components are sufficient to fit the overall envelope, three components, in which a peak at 532.7 eV can be assigned to OH(a), is also successful. The three peak fit is consistent with a model in which OH(a) reduces Au3+ to Au0.showing that both produce acceptable models. Spectra (c) to (d) show 3 peak fits for the remaining spectra in Figure 8.Software required• All AFM data is presented in the raw format created by Bruker Veeco Multimode system. The AFM images can be read using WSxM software1 and contains information about the experimental conditions.• All XPS data is presented in standard VAMAS format with information contained about the experimental conditions. CasaXPS v2.3.19 can be used to read the data amongst many other suitable graphing software.2 Curve fits were made in CasaXPS using a Gaussian-Lorentzian 30:70 mixed lineshape with spin orbit splitting components for the Au(4f), S(2p) and Cl(2p) spectra fixed at 3.7, 1.16 and 1.6 eV, and relative areas of 4:3, 2:1 and 2:1 respectively.• The contact angle chart was plotted using EXCEL 2016• Diagrams were assembled using Inkscape3 and exported as jpg, png or tiff filesReferences1 I. Horcas, R. Fernandez, J. Gomez-Rodriguez, J. Colchero, J. Gomez-Herrero and A. Baro, Rev. Sci. Instrum., 2007, 78, 013705.2 N. Fairley, CasaXPS Manual: 2.3.15 Spectroscopy, Casa Software Ltd, 2009.3 Draw Freely | Inkscape, https://inkscape.org/en/, (accessed 14 February 2018).Research results based upon these data are published at http://doi.org/10.1039/C7FD00210F